首页> 外文会议>2003 Nanotechnology Conference and Trade Show Nanotech 2003 Vol.1 Feb 23-27, 2003 California, USA >Coupled Substrate-Resonator-Electrostatic Simulation and Validation of High-Q MEMS Resonator Performance
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Coupled Substrate-Resonator-Electrostatic Simulation and Validation of High-Q MEMS Resonator Performance

机译:衬底-谐振器-静电耦合仿真和高Q MEMS谐振器性能验证

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Vibration energy transmission from MEMS resonator through anchor to substrate, viz., anchor loss, is examined by utilizing the coupled substrate - resonator -electrostatic numerical model. The substrate and resonator beam are modeled independently and then integrated by enforcing their interface compatibility condition and the electrostatic force equilibrium to arrive at the multiphysics model. The present model has been validated with several reported sing-beam resonators. The validated model indicates that: the anchor loss is a frequency dependent mechanism that increase with increasing frequency, and the resulting equivalent damping coefficient due to anchor loss is 0.15% for 71.8 MHz resonator; the resonant frequency of the beam decreases up to 5% due to substrate flexibilities interacting with the beam at the anchors.
机译:通过使用耦合的基板-谐振器-静电数值模型检查了从MEMS谐振器通过锚固件到基板的振动能量传输,即锚固件损耗。分别对基板和谐振器束进行建模,然后通过强制其界面兼容条件和静电力平衡进行积分,以得出多物理场模型。本模型已经用几个报道的单波束谐振器进行了验证。经验证的模型表明:锚固损耗是一种随频率增加的频率相关机制,对于71.8 MHz谐振器,由锚固损耗引起的等效阻尼系数为0.15%。由于基片的挠性在锚点处与梁相互作用,梁的共振频率最多降低5%。

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