首页> 外文会议>1995 advanced semiconductor manufacturing conference and workshop >Customer/Supplier Partnering to Provide Statistical Models to Predict New Hardware and Process Interactions and Limitations
【24h】

Customer/Supplier Partnering to Provide Statistical Models to Predict New Hardware and Process Interactions and Limitations

机译:客户/供应商合作提供统计模型,以预测新的硬件和流程之间的相互作用和局限性

获取原文
获取原文并翻译 | 示例

摘要

As the semiconductor industry migrates to 200 mm wafers and < 0.5 μm and beyond manufacturing technologies [1], a tremendous responsibility is placed on the equipment suppliers to produce the reliable hardware, software and process(es) required to ensure integration success and continued enhanced technology and manufacturing yields. Traditionally, the customer characterizes their equipment and process(es) to meet their technology needs based on supplier's empirical recommendations, with this rarely resulting in complete shared data or joint learning activities. This paper describes an advanced sputter etch hardware and process characterization effort which produced results comparing the "traditional supplier's" characterization methods (single factor) versus the customer's statistical manufacturing characterization methods (Passive Data Collection and Design of Experiments). The results produced in this study, provided the supplier with a customer based statistical model to predict the behavior and limitations of their advanced sputter etch module, not to mention, an integration and manufacturing tool to predict process settings to achieve the desired technology results. These manufacturing statistical tools and methods, with partnering between a customer and supplier, could become the basis of all future supplier characterizations and support efforts to meet the growing costs and time-to-market needs of both the supplier and customer.
机译:随着半导体行业迁移到200 mm晶圆和<0.5μm并超越制造技术[1],设备供应商肩负着巨大的责任,必须提供可靠的硬件,软件和工艺来确保集成成功并不断增强技术和制造良率。传统上,客户根据供应商的经验推荐来表征他们的设备和过程,以满足其技术需求,这很少导致完整的共享数据或联合学习活动。本文介绍了一种先进的溅射蚀刻硬件和工艺表征工作,该成果将“传统供应商”的表征方法(单因素)与客户的统计制造表征方法(“被动数据收集和实验设计”)进行了比较。这项研究产生的结果为供应商提供了一个基于客户的统计模型,以预测其高级溅射蚀刻模块的行为和局限性,更不用说是一种集成和制造工具,以预测工艺设置以实现所需的技术结果。这些制造统计工具和方法以及客户和供应商之间的合作,可以成为将来所有供应商特性的基础,并可以支持满足供应商和客户不断增长的成本和上市时间需求的工作。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号