An HDL-Based Platform for High Level NoC Switch Testing

摘要

This paper presents a non-scan method of NoC switch testing. The method requires addition of test mode hardware for NoC switches and processing elements which is much less than what is required for most scan methods. Associated with our proposed test mode of an NoC, we have developed a test environment based on high-level switch faults. The test environment applies test packets to the NoC-Under-Test in its test mode and generates an NoC fault dictionary to be used for error detection of an NoC running in the test-mode. Proposed fault models and test strategy will be discussed in this paper.