Frequency Analysis Method for Propagation of Transient Errors in Combinational Logic

摘要

The continuous development of VLSI technology is shrinking the minimal sizes to nanometer region, making circuits more susceptible to transient error. In this paper, we present a frequency analysis method to accurately estimate the possible propagation of transient fault-due glitches through a CMOS combinational circuit. We use the frequency feature of signal and frequency response of electrical system to analyze the propagation of transient error. Experiments show that on average, our approach provides approximately 95% accuracy and several orders of magnitude faster with respect to HSPICE simulation.