晶体硅太阳电池的光衰减效应研究

摘要

The LID defect in CZ silicon consists of substitutional boronatom and stagger type oxygen dimer.The LID defect in mc silicon is related to the metalimpurities or their aggregation at the structural defects.Regeneration treatment is a good way to eliminate the LIDdefects.Electronic injection by forward bias is an economicindustrial way for the elimination of LID defects.