首页> 中文会议>第二届全国电子背散射衍射技术及其应用会议 >Orientation noise in EBSD data gathered adjacent to low angle grain boundaries

Orientation noise in EBSD data gathered adjacent to low angle grain boundaries

摘要

The difference in orientation noise between regions near low angle boundaries and grain interiors has been investigated. Orientation measurements were made on samples of high purity nickel (99.999﹪) cold-rolled to a reduction of 98﹪ and then annealed at 800℃ to give a strong cube texture. A pattern quality type parameter shows lower pattern qualities from volumes near the low angle boundaries. However, despite these differences the orientation noise in near-boundary regions was not found to be significantly worse than that in grain interiors. A significant variation was observed in the orientation noise for grains of different orientation.

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