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Ultrahigh Density Sub-10 nm Cobalt Nanowire arrays: Simulation, Fabrication, and Characterization.

机译:超高密度低于10 nm的钴纳米线阵列:模拟,制造和表征。

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摘要

The simulation, fabrication, and characterization of self-assembled ultrahigh density sub-10nm Co nanowire arrays are presented in this dissertation. The general phase separation nanowire growth simulation was operated based on a modified Ising model. The fabrication process can be summarized as the binary Co-X systems lateral phase separation during physical vapor deposition - the plasma layer deposition with a single alloy Co-X target. The "X" stands for Al or Si. The nanowire fabrication and diameter deduction was achieved by balancing the growth rate and surface diffusivity. For Co-Al binary system, the formed sub-10 nm Co nanowires are of face-centered cubic structure through high-resolution transmission electron microscopy. Plus, the total phase separation happened between Co and Al - Co is not detectable in the surrounding Al matrix via scanning transmission electron microscope elemental mapping. The formed Co nanowire array in Al matrix displays unusual magnetic anisotropy, which is originated from the ultrahigh packing density. For Co-Si binary system, the FCC Co nanowire average diameter is 5.38+/-0.04 nm with wire density 2x1016/m2. The matrix contains both Si and Co. The Co nanowire average diameters of both systems were calculated through in-plane X-ray diffraction, which are consistent with the TEM results within experimental error. XRD reveals that the axis is the nanowire growth direction. The average nanowire diameters of Co-Al system were also calculated through atomic force microscope adhesion images. The diameter vs. deposition rate plot is quantitatively consistent to the predicted theoretic relation.
机译:本文介绍了自组装超高密度亚10nm Co纳米线阵列的仿真,制备和表征。基于改良的伊辛模型进行了一般的相分离纳米线生长模拟。可以将制造过程概括为物理气相沉积过程中的二元Co-X系统横向相分离-用单个合金Co-X靶进行等离子体层沉积。 “ X”代表Al或Si。通过平衡生长速率和表面扩散率来实现纳米线的制造和直径的减小。对于Co-Al二元体系,通过高分辨率透射电子显微镜观察,所形成的10 nm以下的Co纳米线为面心立方结构。另外,通过扫描透射电子显微镜元素映射,无法在周围的Al基体中检测到Co与Al之间发生的总相分离。在Al基体中形成的Co纳米线阵列显示出异常的磁各向异性,这是由超高堆积密度引起的。对于Co-Si二元系统,FCC Co纳米线的平均直径为5.38 +/- 0.04 nm,线密度为2x1016 / m2。基质同时包含Si和Co。两个系统的Co纳米线平均直径是通过面内X射线衍射计算的,这与TEM结果在实验误差范围内一致。 XRD显示轴是纳米线的生长方向。还通过原子力显微镜粘附图像来计算Co-Al系统的平均纳米线直径。直径与沉积速率的关系图与预测的理论关系在数量上是一致的。

著录项

  • 作者

    Tian, Yuan.;

  • 作者单位

    The University of Nebraska - Lincoln.;

  • 授予单位 The University of Nebraska - Lincoln.;
  • 学科 Nanotechnology.;Engineering Materials Science.
  • 学位 Ph.D.
  • 年度 2015
  • 页码 144 p.
  • 总页数 144
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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