Grain velocity measurement using a linear image sensor

摘要

Abstract: -oxide semiconductor (MOS) linear image sensor consisting of an array of 128 self-scanning, linear photodiodes was used to measure the velocity of falling grain. The sensor was used to obtain an image of the falling grain wait a known time interval and then obtain a second image. Comparison of the two images permitted determination of the position displacement experienced by the grain. Optical relationships were used to convert the image displacement to grain displacement. Grain displacement divided by the time interval yielded grain velocity. This paper addresses the sensor and data acquisition hardware, the digital signal processing software, and calibration of the sensor. !6