Implementation of Embedded Cores-Based Digital Devices in JBits Java Simulation Environment

摘要

This paper proposes test design architecture suitable for built-in self-testing (BIST) of embedded cores-based digital circuits by using a reconfigur-able device. In the paper, a sample circuit under test (CUT) and its corresponding space compressor were realized in Java language, downloaded, and then tested at runtime in a simulation environment written in JBits.