首页> 外文会议>Conference on Interferometry XI: Techniques and Analysis, Jul 8-10, 2002, Seattle, USA >Three-dimensional step-height measurement using Mirau-type spectral interference microscope with acousto-optic tunable filter as frequency scanning device
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Three-dimensional step-height measurement using Mirau-type spectral interference microscope with acousto-optic tunable filter as frequency scanning device

机译:使用Mirau型光谱干涉显微镜和声光可调滤光片作为频率扫描装置进行三维步高测量

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摘要

We propose a non-mechanical scanning Mirau-type spectral interference microscopic imaging system for the measurement of three-dimensional step-height of discontinuous objects. In this system a superluminescent diode is used as a broad-band light source, and an acousto-optic tunable filter (AOTF) as a high-resolution frequency scanning device. The interferometric system was made unbalanced by putting the reference mirror position exactly half-way between the top and bottom of the total step-height of the discontinuous object. While scanning the frequency of the broad-band light source using AOTF, the interference fringes move in opposite directions on the top and bottom of the object, respectively. A two-dimensional Fourier transform method was used for the unique determination of the sign of fringe movement over a large area of the object without any photo-detectors and fringe counters. From the detected sign of the fringe movement and phase information, the three-dimensional step-height is measured. Experimental results of the measurement of 100μm step-height are presented. The main advantages of the proposed system are non-mechanical scanning and large measurement range without ambiguity in the sign of phase.
机译:我们提出了一种非机械扫描Mirau型光谱干涉显微成像系统,用于测量不连续物体的三维步高。在该系统中,将超发光二极管用作宽带光源,并将声光可调滤波器(AOTF)用作高分辨率频率扫描设备。通过将参考反射镜位置恰好位于不连续物体总步高的顶部和底部之间的一半位置,可以使干涉测量系统不平衡。在使用AOTF扫描宽带光源的频率时,干涉条纹分别在对象的顶部和底部沿相反的方向移动。二维傅立叶变换方法用于唯一确定物体大面积上条纹移动的信号,而无需任何光电探测器和条纹计数器。根据检测到的条纹运动和相位信息的符号,测量三维步高。给出了测量100μm步长的实验结果。所提出的系统的主要优点是非机械扫描和较大的测量范围,并且在相位符号上没有歧义。

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